Please use this identifier to cite or link to this item: https://research.matf.bg.ac.rs/handle/123456789/1881
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dc.contributor.authorCuparić, Marijaen_US
dc.contributor.authorMilošević, Bojanaen_US
dc.contributor.authorObradović, Markoen_US
dc.date.accessioned2025-04-02T18:49:57Z-
dc.date.available2025-04-02T18:49:57Z-
dc.date.issued2019-
dc.identifier.urihttps://research.matf.bg.ac.rs/handle/123456789/1881-
dc.description.abstractWe present new classes of consistent goodness-of-fit tests based on V-empirical Laplace transforms. The test statistics represent the quadratic and supremum-norm distances between appropriate functions. We inspect their properties for the particular case of testing null exponential distribution. In an extensive comparison study, we show that the tests have high Bahadur efficiencies. In addition, we compare them in the cases of small and moderate sample sizes via empirical powers.en_US
dc.language.isoenen_US
dc.publisherPalermo : Institute of Mathematical Statisticsen_US
dc.titleNew consistent characterization based goodness-of-fit testsen_US
dc.typeConference Objecten_US
dc.relation.conferenceEuropean Meeting of Statisticians(2019 ; Palermo)en_US
dc.relation.publicationEuropean Meeting of Statisticians EMS 2019en_US
dc.identifier.urlhttp://www-math.sp2mi.univ-poitiers.fr/~yslaoui/EMS19-Book_of_Abstracts.pdf-
dc.contributor.affiliationProbability and Mathematical Statisticsen_US
dc.contributor.affiliationProbability and Mathematical Statisticsen_US
dc.contributor.affiliationProbability and Mathematical Statisticsen_US
dc.description.rankM32en_US
dc.relation.firstpage174en_US
dc.relation.lastpage174en_US
item.openairetypeConference Object-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
item.languageiso639-1en-
item.cerifentitytypePublications-
crisitem.author.deptProbability and Statistics-
crisitem.author.deptProbability and Statistics-
crisitem.author.deptProbability and Statistics-
crisitem.author.orcid0000-0001-5071-8350-
crisitem.author.orcid0000-0001-8243-9794-
crisitem.author.orcid0000-0002-6826-3232-
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