Please use this identifier to cite or link to this item: https://research.matf.bg.ac.rs/handle/123456789/1878
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dc.contributor.authorCuparić, Marijaen_US
dc.contributor.authorMilošević, Bojanaen_US
dc.contributor.authorObradović, Markoen_US
dc.date.accessioned2025-04-02T12:24:42Z-
dc.date.available2025-04-02T12:24:42Z-
dc.date.issued2018-
dc.identifier.urihttps://research.matf.bg.ac.rs/handle/123456789/1878-
dc.description.abstractNew goodness-of-fit tests are proposed which employ the equidistribution characterizations. Based on V-empirical Laplace transforms of equidistributed statistics, test statistics of L<sup>p</sup>-type are constructed. Their asymptotic properties are derived. To assess their quality, the approximate Bahadur efficiency is used. For small sample sizes, a simulated power study is performed. The tests are shown to be very efficient and powerful in comparison to some common competitors.en_US
dc.language.isoenen_US
dc.publisherPisa : ERICM Workgroupen_US
dc.titleNew consistent goodness-of-fit tests based on V-empirical Laplace transformsen_US
dc.typeConference Objecten_US
dc.relation.conferenceCMStatistics(11 ; 2018 ; Pisa)en_US
dc.relation.publication11. CMStatistics 2018en_US
dc.identifier.urlhttps://www.cmstatistics.org/CMStatistics2018/docs/BoACFECMStatistics2018.pdf?20181120232255-
dc.contributor.affiliationProbability and Mathematical Statisticsen_US
dc.contributor.affiliationProbability and Mathematical Statisticsen_US
dc.contributor.affiliationProbability and Mathematical Statisticsen_US
dc.relation.isbn978-9963-2227-5-9en_US
dc.description.rankM32en_US
dc.relation.firstpage81en_US
dc.relation.lastpage81en_US
item.languageiso639-1en-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairetypeConference Object-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
crisitem.author.deptProbability and Mathematical Statistics-
crisitem.author.deptProbability and Mathematical Statistics-
crisitem.author.deptProbability and Mathematical Statistics-
crisitem.author.orcid0000-0001-5071-8350-
crisitem.author.orcid0000-0001-8243-9794-
crisitem.author.orcid0000-0002-6826-3232-
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