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Please use this identifier to cite or link to this item: https://research.matf.bg.ac.rs/handle/123456789/161
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dc.contributor.authorCuparić, Marijaen_US
dc.contributor.authorMilošević, Bojanaen_US
dc.contributor.authorObradović, Markoen_US
dc.date.accessioned2022-08-06T16:46:15Z-
dc.date.available2022-08-06T16:46:15Z-
dc.date.issued2022-
dc.identifier.issn15787303en
dc.identifier.urihttps://research.matf.bg.ac.rs/handle/123456789/161-
dc.description.abstractWe present new consistent goodness-of-fit tests for exponential distribution, based on the Desu characterization. The test statistics represent the weighted L2 and L∞ distances between appropriate V-empirical Laplace transforms of random variables that appear in the characterization. In addition, we perform an extensive comparison of Bahadur efficiencies of different recent and classical exponentiality tests. We also present the empirical powers of new tests.en
dc.relation.ispartofRevista de la Real Academia de Ciencias Exactas, Fisicas y Naturales - Serie A: Matematicasen
dc.subjectBahadur efficiencyen
dc.subjectExponential distributionen
dc.subjectGoodness-of-fiten
dc.subjectLaplace transformen
dc.subjectV-statisticsen
dc.titleNew consistent exponentiality tests based on V-empirical Laplace transforms with comparison of efficienciesen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s13398-021-01184-3-
dc.identifier.scopus2-s2.0-85119879409-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/85119879409-
dc.contributor.affiliationProbability and Mathematical Statisticsen_US
dc.contributor.affiliationProbability and Mathematical Statisticsen_US
dc.contributor.affiliationProbability and Mathematical Statisticsen_US
dc.description.rankM21aen_US
dc.relation.volume116en
dc.relation.issue1en
item.fulltextNo Fulltext-
item.openairetypeArticle-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
crisitem.author.deptProbability and Mathematical Statistics-
crisitem.author.orcid0000-0001-5071-8350-
crisitem.author.orcid0000-0001-8243-9794-
crisitem.author.orcid0000-0002-6826-3232-
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